Used KLA / TENCOR 2125 #9186027 for sale

KLA / TENCOR 2125 is a mask and wafer inspection equipment which offers automated wafer and mask inspection and measurement for defect-free production. The system provides advanced features such as high-precision optics and fully automated wafer and mask locating, scanning, and analysis. The unit is equipped with an achromatic slit projection camera and a telecentric projection optics machine. The slit camera provides a larger and more homogeneous field of view, allowing the tool to capture multiple layers of complex shapes with greater accuracy. The telecentric projection optics asset ensures consistent image quality over its field of view, allowing for more accurate measurement results. KLA 2125 model uses a range of algorithms to detect and measure a variety of defects, including contaminants, particle defects, and other critical particles. These algorithms analyze the images and generate a confidence score based on the defects detected. The equipment also includes a built-in, highly accurate measurement system for both lateral and vertical measurement. This allows for accurate and repeatable measurements across the wafer. In addition, the unit offers features to measure contrast and circuit critical dimensions. The machine includes advanced features such as VTRF (variable-tolerance reference file) support, OCR (optical character recognition), and defect repair for removing contaminants, repairing photoresist defects, and pattern filling for critical patterns. The VTRF feature allows operators to customize the tool to meet their individual requirements and production needs. The asset also includes a number of user-friendly features such as a touch-screen monitor for easy navigation, an intuitive menu model, and a wide range of image adjustment and zoom capabilities. The equipment is highly flexible and configurable, allowing it to be customized for any particular application. Overall, TENCOR 2125 system is a powerful and reliable mask and wafer inspection unit offering automated scanning, analysis, and measurement. Its advanced features and user-friendly interface make it an ideal choice for semiconductor fabrication and quality control.