Used KLA / TENCOR 2132 #293665007 for sale

KLA / TENCOR 2132 is a mask and wafer inspection equipment designed to measure field photographs of photolithographic masks. It utilizes a novel combination of technologies, such as laser scanning, multiple video cameras, and object identification algorithms, in order to detect and measure critical features on the mask. KLA 2132 system is capable of scanning across the surface of a mask, and can detect very precise features such as lines and patterns, as well as other important features such as pitch, alignment, and symmetry. The unit utilizes a laser to scan across the mask, and is capable of accurately detecting and measuring line widths from a wide range of angles. In addition, TENCOR 2132 also utilizes multiple high resolution video cameras which are capable of capturing detailed images across the surface of the mask. 2132 has proven to be a reliable and accurate tool for inspecting masks and wafers. It has a powerful imaging machine that allows for the detection of the smallest features and allows for the proper alignment of each feature on the surface of the mask. In addition, KLA / TENCOR 2132 utilizes advanced object identification algorithms which are capable of recognizing patterns and defects on the surface of the mask quickly and accurately. Furthermore, KLA 2132 is capable of analyzing multiple passes of inspection data while allowing the user to quickly identify any issues and defects encountered during the inspection process. The tool includes a library of thousands of standard IC layout patterns, and is capable of detecting any non-standard features in the pattern. In addition, TENCOR 2132 is also capable of automatically analyzing the alignment of each feature on the mask for accurate positioning. In short, 2132 is an advanced mask and wafer inspection asset which uses advanced laser scanning, video cameras, and object identification algorithms to accurately detect and measure features on the mask for a wide range of applications. Its powerful imaging and analysis capabilities make it a reliable tool for verifying the quality of IC designs prior to production.