Used KLA / TENCOR 2132 #293798142 for sale

KLA / TENCOR 2132 Mask & Wafer Inspection Equipment is a fully automated inspection solution employed in semiconductor fabrication. It uses a high-resolution digital imaging system to detect defects, defined as variation in either topography or reflectivity, in photomasks and wafers. An air bearing stage transports the sample across the advanced brightfield and darkfield optical systems, which provide clear contrast of surface topology and feature edge contrast to facilitate advanced defects classification. KLA 2132 has the ability to accommodate photomasks up to 12 inches, as well as semiconductor wafers from 200 millimeters to 450 millimeters. Various stage configurations are available and the inspection unit can be configured for either low-volume production or high-volume manufacturing. Combined with sophisticated accounting functionality, ranging from scan angles to number of exposures and layers, TENCOR 2132 provides detailed data analysis, defect trend analysis and other reporting abilities. The easy-to-use on-screen user interface that allows a variety of analytical mode selection. The inspection suite also includes wafer alignment and image analysis software, and the suite is completely compatible with both the industry's latest compatible inspection requirements and computer interfaces. 2132 Mask & Wafer Inspection Machine is the ideal tool for substrates of varying sizes and thickness, utilizing advanced visual inspection and slide analysis capabilities in the traceable and reliable environment of a semiconductor fabrication facility. Its brightfield and darkfield systems enable the distinction between topographic features and optical contrast defects. Its integrated software suite ensures efficient data analysis, defect tracking and reporting. And its air bearing stage allows for greater sample accuracy and operation. Together, these features make KLA / TENCOR 2132 Mask & Wafer Inspection Asset a cutting-edge tool for fast and efficient semiconductor fabrication.