Used KLA / TENCOR 2132 #9145523 for sale

KLA 2132W Mask & Wafer Inspection equipment is the perfect solution for inspecting both masks and wafers used in the semiconductor industry. The system integrates multiple systems and processes that increase the accuracy and efficiency of manual and automated unit inspection. KLA / TENCOR 2132 combines advanced technology with intuitive software, hardware, and ergonomic design. The machine includes a 4 inch color LCD touchscreen that allows for easy interaction with the tool. This asset also features two 30X magnification microscopes and Automated Inspection (AI) clustering and classification to identify defects in masks and wafers. AI enables more accurate detection, classification, and part tuning, and enables faster throughput. TENCOR 2132W employs high-resolution imaging to provide detailed insight into small particles, defects, and bumps in difficult-to-see parts. The model features real-time zoom, pan, and image rotation to examine the entire area of interest. The equipment can also export and store digital images for future reference. KLA 2132 also comes with a built-in defect recognition system that can identify basic defect types including lit, partially lit, dark, and partially dark features in masks and wafers. The unit is equipped with a low-noise imaging machine that reduces the image noise and improves image quality. This ensures that the tool is able to detect small defects and intricate patterns. TENCOR 2132 is an incredibly reliable asset that provides accurate results quickly and efficiently. It is designed to be highly efficient and ergonomic, ensuring the user doesn't have to worry about complicated setup or formatting. Furthermore, with a rugged, dust-resistant design, the model can withstand hostile environments and tough production conditions. Overall, 2132 Mask & Wafer Inspection equipment is an extremely capable and reliable system that is designed to be easy to use and provides accurate results. With its AI and microscopy technologies, the unit is capable of identifying a wide range of defects that can cause major issues down the line. Its features enable enhanced productivity and increased yield for improved ROI, making it an invaluable tool for any semiconductor industry professional.