Used KLA / TENCOR 2135 #9230398 for sale

KLA / TENCOR 2135 is a mask and wafer inspection equipment designed to maximize throughput and bring unparalleled accuracy to the process of inspecting semiconductor chips. The system is based on a parallel network of photonics sensors, and a powerful imaging subsystem to detect and discriminate between patterns, defects, and materials on the surface of integrated circuits. KLA 2135 uses advanced laser ranging technology to inspect complex photomasks and reticles from advanced semiconductor designs. The unit is designed to be able to quickly detect and analyze intricate shapes and patterns on the wafer, detecting any defects or irregularities on the surface. By using a high power laser, it can examine features down to the nanometer scale, providing a level of accuracy that current systems can't achieve. The machine employs the latest in optical imaging and detection technology to differentiate between different materials on the wafer and within integrated circuits. The advanced software is designed to identify defects such as exposed vias, bridging between contact points, and misaligned transistors. It can also be tuned to detect a wide range of foreign materials, including contaminants and dielectrics. TENCOR 2135 gives operators a wide range of control over the parameters of the mask and wafer inspection. It can be used to adjust the exposure level, the gain, and the intensity of the laser beam. Additionally, the tool can detect out of tolerance levels of stress, oxidation, contamination, and opacity. In this way, the asset can identify problems quickly and accurately, allowing for precise and accurate debug and repair of integrated circuits. 2135 also features advanced options for reporting results. It has the ability to save high resolution images, standard test patterns, and graphs of results for later review. This makes it easy for operators to quickly review data from previous tests, providing a powerful tool for problem solving. Overall, KLA / TENCOR 2135 is a powerful mask and wafer inspection model that brings unparalleled accuracy and speed to the process of semiconductor chip production. It's advanced optics, imaging, and detection technology make it capable of performing highly accurate inspections and identifying small defects quickly and easily. The integrated reporting equipment makes it easy to review and store test results, making it ideal for fast and reliable problem solving.