Used KLA / TENCOR 2139 #9249043 for sale

KLA / TENCOR 2139 is a leading protective product designed for automated mask and wafer inspection in semiconductor and electronics production environments. It provides an easy and reliable solution for the demanding inspection requirements in the industry with an accuracy higher than that of traditional inspection methods. KLA 2139 equipment helps identify dirt, contaminants and other defects that can cause yield losses and reduce production throughput. TENCOR 2139 is built with a novel combination of advanced technologies, including imaging, wafer shape recognition, image segmentation, and image correlation in a single system. The unit integrates both traditional and 3D imaging for comprehensive inspection of mask patterns and wafer surface topography. This allows it to detect very small defects, such as scratches, pattern defects, irregular patterns, voids, particles, foreign material, and thermal damage. One of the primary advantages of 2139 is its ability to detect defects down to the nanometer scale and exactness level. In addition, it uses a variety of techniques, such as fast fourier transform (FFT), pixel averaging, and statistical operations, to allow for more refined inspection. It also offers smart defect categorization to simplify inspection. KLA / TENCOR 2139 machine provides high throughput and reliable inspection results through its fast scan speed, continuous belt speed adjustment, and advanced metrology processes. Additionally, it is capable of inspecting larger substrates, up to 200mm, making it a great choice for high-volume production environments. KLA 2139 tool is designed to meet industry standards such as SEMI F7 and SDE-6, as well as complies with most relevant international safety standards, including CE, UL, and FCC. Moreover, it also provides high compatibility with other product and factory manufacturing solutions, allowing for seamless integration and smarter communication. Overall, TENCOR 2139 asset is a powerful, efficient, and intelligent solution for automated mask and wafer inspection in the semiconductor and electronics industry. Its market-leading combination of advanced technologies and features aids in detecting and categorizing defects quickly and accurately, ensuring seamless production and higher quality output. It is ideal for meeting stringent industry standards and requirements, and for meeting the demanding needs of high-volume production lines.