Used KLA / TENCOR 2318 #9189833 for sale

KLA / TENCOR 2318
ID: 9189833
Wafer inspection system.
KLA / TENCOR 2318 is an automated mask and wafer inspection system designed to quickly identify defects and manufacturing defects in semiconductor chips. This inspection system is based on brightfield microscopy, a form of digital microscopy optically lit against a white or other light-colored background to enhance contrast. KLA 2318 can magnify chips up to 2400x, with great accuracy due to the integrated image sensor and processors. Its bright, even lighting and high magnification capabilities ensure that any defects in both the mask and wafer will be easily visible. In addition, TENCOR 2318 has an extensive library of defect algorithms, which enables it to classify specific defects more accurately than manual inspection. 2318 is capable of automatically adjusting the field of view and image size during the inspection process, allowing for thorough inspection of complex features. This adjustable field of view also allows for quick changeover from open to closed mask images. Additionally, KLA / TENCOR 2318 has an optical microscope with a built-in motorized stage to make precise positioning and manipulation of the wafer easier, ensuring that every surface area of the chip can be inspected. KLA 2318 also features multi-channelvideo management, allowing users to view and inspect many images on multiple channels and sub-channels. TENCOR 2318 also offers improved productivity, with exceptionally fast setup time and a variety of advanced image analysis functions, as well as a 3D viewing tool for the most detailed inspections. Overall, 2318 is a powerful tool for the inspection of masks and wafers. It allows for quick and accurate evaluation of complex features in chips, as well as a variety of advanced inspection capabilities. By combining state-of-the-art brightfield microscopy with advanced image analysis, KLA / TENCOR 2318 is an asset to any semiconductor R&D department or manufacturing facility.
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