Used KLA / TENCOR 2350 #9261852 for sale

KLA / TENCOR 2350 is a high tech mask and wafer inspection equipment designed to identify defects in integrated circuits. This system combines advanced imaging technology, software algorithms, and high-speed pattern recognition to quickly and accurately detect any defects on the integrated circuits. The unit is capable of detecting a wide range of defects, from simple scratches to complex particles. The machine uses a CCD camera combined with a super-bright light source for detail imaging of the surfaces of the metal mask or integrated circuits. This imaging technology is capable of producing images with a resolution up to 5 micrometers. Once the images are acquired, powerful software algorithms are employed for detailed pattern recognition that locates possible defects. The tool utilizes various image-processing techniques to detect defects such as particle contamination, pinholes, edge defects, surface roughness and resistivity changes. As part of the inspection process, the asset performs advanced statistical-based measurements such as center location, circularity, or defect size. KLA 2350 comes equipped with a variety of standard features, including flexible pattern library tools for the user to create or modify custom detection criteria. Additionally, the model includes advanced analysis and measurement capabilities for determining the underlying causes of detected defects. Finally, the equipment comes with an integrated reporting tool which allows the user to save and print detailed reports regarding the results of the inspection. These reports are then used to assess the overall quality of the integrated circuits. TENCOR 2350 is a powerful mask and wafer inspection system that provides comprehensive defect detection and analysis capabilities. By combining advanced imaging, pattern recognition, and statistical-based measurements, this unit is able to quickly and accurately detect any defects on the integrated circuits. This machine is ideal for companies looking for an efficient and reliable method of detecting defects in their integrated circuits.