Used KLA / TENCOR 239E #9041907 for sale

KLA / TENCOR 239E
ID: 9041907
Mask inspection system.
KLA / TENCOR 239E Mask and Wafer Inspection Equipment is the industry-leading tool for inspecting critical optical and electrical properties of masks and wafer components used in the fabrication of printed circuit board and semiconductor devices. KLA 239E employs advanced laser and machine vision tactile inspection technologies, as well as innovative proprietary metrology systems, to detect and characterize defects down to sub-micron sizes, including pin/pad shorts, residues, bridges, breaks, misalignments, and more. Designed for ease of use and performance, TENCOR 239E is a multi-sensor system equipped with simultaneous power, lightning, and optical inspection capability. It features automatic alignment using the TetraTile technology, high-resolution imaging, and unique dual vision capabilities that allow for examination from two different angles. Using both the OmniView and laser locations simultaneously, users can detect defects even in the most challenging mask targets. The unit also features a simplified user interface, with an intuitive wafer map display and enhanced programmable chip templates. 239E's unique tribrid optical design incorporates three components - a laser, CCD camera, and mask - to capture sophisticated images of wafer components and detect the most minute defects. It can capture micron-level resolution images with 65 turquoise pixels per 100um. KLA / TENCOR 239E's LED-based power mechanism increases throughput and reliablity by ensuring accurate pixel measurements to 1.0um. For metrology, KLA 239E is integrated with Suss NanoAnalysis software that allows users to control critical dimensions, feature height and size, wafer profile, centerline, and edge registration. This powerful software tool gives users the ability to determine the 3-D shape of complex components and use the measurement results to create reports and analyze data. Overall, TENCOR 239E Mask and Wafer Inspection Machine provides fast, efficient, and reliable defect detection and measurement capabilities for quality and yield improvement. It is the ideal solution for any organization looking for a sophisticated and accurate inspection tool.
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