Used KLA / TENCOR 2552 #293587731 for sale

KLA / TENCOR 2552 is an advanced mask & wafer inspection equipment designed to identify defects on semiconductor wafers and masks. It has a wide range of features and capabilities that enable it to accurately detect and classify defects that can impact chip performance, yield, and reliability. At its core, the system works by capturing in-process images of the semiconductor wafers and masks. It then applies a variety of algorithms, analysis techniques, and image processing to analyze each image and detect potential defects. The image analysis is aided by powerful optics, including automatic focus and contrast, as well as a 5 megapixel digital camera to ensure high quality results. KLA 2552 is capable of performing a range of different inspection tasks. It can identify both surface and near-surface defects, as well as particles, cracks, electrostatic discharge (ESD) damage, and other anomalies. It also supports advanced inspection methods such as wafer array inspection, burr scan, grating inspection, and boundary scan. The unit contains an image review station, which provides various tools and functions useful in visually inspecting wafers or masks. It includes both manual and automated inspection modes and can generate a range of reports, including reports summarizing defect trends. Data collected by the machine may also be used for failure analysis and for creating statistics. In addition, TENCOR 2552 offers a number of features that ensure user safety. It is designed with a tough plastic housing, designed to protect from static electricity and other non-ionizing radiation sources. It also comes with ground-fault circuit interrupter protection and other safety protocols, to ensure compliance with industry standards and regulations. In conclusion, 2552 is a powerful mask & wafer inspection tool, that is designed to ensure quality and safety. Its wide range of features and capabilities, along with its excellent optics and image analysis, make it a reliable and efficient asset for detecting and classifying semiconductor defects.