Used KLA / TENCOR 2552 #293659802 for sale

KLA / TENCOR 2552 is a powerful mask and wafer inspection equipment that has been designed to accommodate a variety of semiconductor applications. It is designed with a high-throughput architecture to facilitate quick and reliable inspection systems. KLA 2552 is equipped with an automated high-performance imaging system to enable high-definition imaging at speeds up to 273 inline images/second and port-to-port image transfer speeds up to 546 Mbps. The unit is based on a CMOS image sensor with a 12-bit, 3-tap line scan camera and a 256 gray-level digitizer capable of accurate inspection of small features. Additionally, the machine is designed to be adaptable and configurable to a variety of imaging needs and can be easily installed and operated with minimal setup and maintenance requirements. The tool is equipped with a variety of features, including multi-mode background suppression, automated defect classification methodology, broad-field-of-view defect detail gathering, and variable field-of-view microscope imaging. Examination methods such as defect-visualization, false defect rejection, hot spot data recovery, patterned defect management, and additional methods can be used with TENCOR 2552 to increase reliability and consistency of imaging and inspection. 2552 also provides an array of ergonomic functions such as tilt-up design, an easy-access inspection window, and ergonomic joystick with a comfortable wrist rest to reduce fatigue. Additionally, the asset has a graphical user interface that helps to improve the user experience, allowing for intuitive navigation of the controls and settings. KLA / TENCOR 2552 has a variety of capabilities that make it well-suited for semiconductor applications. This includes sub-pixel defect detection and automated defect tracking, integrated defect database and analysis, and a host of other features. Additionally, KLA 2552 combines exceptional resolution, speed, and robustness to make it one of the best choices for mask and wafer inspection.