Used KLA / TENCOR 2608 #9272633 for sale

KLA / TENCOR 2608 is a Mask and Wafer Inspection (MWI) equipment that meets semiconductor manufacturing requirements for defect inspection and characterization. It is designed to provide real-time actionable insights into the quality and reliability of interactive mask and wafer materials. The system utilizes advanced semiconductor imaging technology to rapidly inspect a variety of advanced dielectric and metallic materials for defects, with an accuracy and a false-alarm rate unmatched by other industry-standard MWI systems. KLA 2608 is equipped with a variety of powerful, yet easy-to-use functionality. Featuring simultaneous, twice-view inspection algorithms, it can automatically detect very small defects across a wide variety of areas including etched, baffled and electrically-charged interfaces such as Metal-oxide-semiconductor and Silicon-on-Insulator (SOI) structures. By facilitating in-depth metrology, the high-resolution imaging unit can also analyze defect-free layers for non-defect features, such as patterns or features that need to be further identified or characterized. The machine is capable of capturing both 2D and 3D imaging in one pass and can provide real-time feedback on device performance. TENCOR 2608 includes a range of advanced features designed to further enhance the user experience. Its high-resolution, automated image capture technology enables users to quickly review and analyze device performance. Its Smart Defect Identification (SDI) technology helps users identify and differentiate real defects versus false alarms, as well as providing a detailed history of defects and other non-defect features. In addition, Smart Scene Change Detection (SSCD) allows users to compare multiple inspection scenes and adjust their inspections accordingly. 2608 also offers a range of reporting and analysis tools that enable users to quickly and easily review defect data. Reports can be viewed and compared side by side, and the tool includes enhanced search capabilities to help users identify trends and correlations. With its integrated communications tools, users can quickly and easily share their data across a variety of platforms and with stakeholders, ensuring that all parties are kept up to date on device performance. Overall, KLA / TENCOR 2608 is an advanced, reliable, and cost-effective MWI asset. It offers a range of powerful features, including defect detection, defect-free layer analysis, image capture, defect-tracking, and reporting capabilities. Its ease-of-use and advanced analytics allow users to gain actionable insights quickly and easily, helping to ensure that interactive mask and wafer materials are of the highest quality and reliability.