Used KLA / TENCOR 2830 #9401094 for sale

KLA / TENCOR 2830 wafer testing and metrology equipment is a comprehensive solution for top-down real-time wafer-level inspection and defect detection applications. The system combines large dynamic range imaging with small footprint for efficient review of defect sites. The unit is designed for testing and analysis of the dynamic range and particle characteristics of wafer structures including features sizes from microns to submicrons. Additionally, the machine can also be used for other critical wafer-level tests like bridging, etching and process characterization. KLA 2830 tool utilizes a field emitters array (FEA) technology to deliver high-resolution images, with a maximum resolution of 64 um/pixel. The asset also offers a variety of performance options, such as full area characteristics, top-down imaging, particle detection, and metrology. Moreover, the model utilizes unique light transmission technology to photograph and detect particles, allowing the user to detect particles as small as 0.2 um. TENCOR 2830 also includes advanced software that provides users with automated and improved test capabilities. Features include an adaptive data separation and collection capability to facilitate efficient review of data. Other notable software features include a powerful search engine, defect classification and annotation, detailed statistical data analysis and visual reporting. For user-friendly equipment operation and robust performance, 2830 system features an intuitive interactive graphical user interface. The interface allows users to review various unit settings and analyze data quickly. The machine also provides users with the ability to store and recall settings, as well as backup data quickly. KLA / TENCOR 2830 wafer testing and metrology tool delivers the best-in-class static and dynamic measurement and analysis capabilities. Its small footprint and large dynamic range make it an ideal solution for large scale production and inspection of wafers. Additionally, with its array of advanced software features and intuitive user interface, it is a powerful and reliable tool for wafer-level testing and analysis.