Used KLA / TENCOR 3905 #9303266 for sale

KLA / TENCOR 3905 is a high-speed mask and wafer inspection equipment designed to provide defect identification and verification. This system provides a cost-effective and reliable method of identifying potential flaws in the lithography process for chips and other semiconductors. KLA 3905 is powered by an advanced digital signal processor (DSP) to allow for rapid detection and classification of defects. The device is outfitted with an imaging subsystem which provides high-resolution images of defects. It also features an advanced edge detection algorithm which allows it to accurately identify edges, cracks, blurriness, and other abnormalities. Additionally, it has an illumination subsystem that provides both vertical and horizontal illumination to clearly identify defects even when they are overlapping one another. TENCOR 3905 is capable of inspection speed up to 10 times faster than most other inspection technologies, making it a valuable tool for speed driven inspection operations. The unit also offers two types of inspection accuracy - manual (for extremely small-sized non-critical defects) and enhanced (for larger sized critical defects); this allows for greater fault recognition accuracy. Furthermore, 3905 can capture detailed images of the 28nm feature size which enables the use in complex chip designs. In addition to its speed and accuracy, KLA / TENCOR 3905 is designed to be low-maintenance; it requires less than 8 hours of annual maintenance and lacks any consumables, making it an affordable and reliable device. Along with its various features and functions, the machine is designed for operation in clean room environments and is fully compliant with accepted industry standards. Overall, KLA 3905 is an effective and reliable mask and wafer inspection tool for those seeking to ensure flawless lithography for semiconductor fabrication. Its combination of speed, accuracy and cost-effectiveness make it a valuable asset for anyone involved in the semiconductor industry.