Used KLA / TENCOR 7200 #9272631 for sale

KLA / TENCOR 7200 equipment is an all-in-one mask and wafer inspection system that provides both fast and accurate inspection and defect analysis. This unit is commonly used in the semiconductor and display industries in order to inspect and detect physical defects, contaminants, and electrical faults. KLA 7200 machine utilizes advanced optical technology to quickly inspect both masks and wafers with precision accuracy. The tool combines advanced video stereo microscopes, telecentric and infinity optics, ability to handle a range of magnifications and depths of field, high resolution and sensitivity detectors, powerful image processing and imaging processing software, and a motorized XYZ working stage to quickly image and inspect large fields of view. The asset also provides sophisticated defect classification software and technologies to automatically classify various types of critical defects. The model uses a combination of high resolution imaging and code-assisted defect detection for accurate and fast wafer and mask inspection. The equipment's imaging technology can capture and store high-resolution images of up to 32 megapixels per pixel. In addition, the system's powerful software can detect various types of defects, including particles, scratches, crystalline defects, and line discontinuities. The unit also has a proprietary web-based platform that allows users to easily access, control, and review inspection results. TENCOR 7200 machine is built to meet the rigorous demands of the semiconductor and display industries. It is designed to provide high throughput, efficiency, and cost savings across multiple production steps. In addition, the tool offers excellent environmental tolerance, robustness and performance. 7200 is a versatile, reliable and accurate asset that provides the necessary tools to quickly find and analyze physical defects and electrical faults in both wafers and masks. It combines advanced optical technology, sophisticated software algorithms, and a wide variety of specific imaging and sample handling capabilities to efficiently and effectively identify defective products.