Used KLA / TENCOR Archer 10 XT+ #9313119 for sale

ID: 9313119
Wafer Size: 12"
Vintage: 2006
Overlay inspection system, 12" 2006 vintage.
KLA / TENCOR Archer 10 XT+ is a mask and wafer inspection equipment designed for high-performance wafer defect and surface analysis. Utilizing high-resolution imaging technology, KLA Archer 10 XT+ is capable of high throughput detection of even the smallest wafer particles and defects at depths beyond 30μm. Combined with a high-speed, multi-spectral light source, TENCOR Archer 10 XT+ is well-suited for critical process control applications such as mask alignment, die bonding and reticle inspection. Archer 10 XT+ features an intuitive graphical user interface designed to simplify the acquisition, analysis and reporting of inspection results. This user-friendly interface allows for a variety of settings to be adjusted, including the magnification, light source, and motor control. Additionally, the system is capable of micro-autofocus and microspot metrology through the integration of two galvanometer mirrors, which helps to ensure that high-resolution screening is achieved. The unit's software is fully compatible with leading industry data platforms from Olympus, Applied Materials and KLA. This enables ease of use and data compatibility across a variety of applications. In addition, the machine also features a unique analysis engine designed to streamline data analysis, allowing for quick and accurate inspection. With an impressive list of features, KLA / TENCOR Archer 10 XT+ is an advanced and versatile tool for high-end wafer inspection. Its intuitive user interface, advanced software and micro-autofocus technology combine to produce accurate and efficient results, making it suitable for a variety of critical processes. From mask alignment to die bonding, KLA Archer 10 XT+ is an effective tool for high-precision wafer inspection.
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