Used KLA / TENCOR Archer 100 #9372751 for sale

KLA / TENCOR Archer 100 is a mask and wafer inspection equipment that combines advanced optics and image processing to enable early detection and diagnosis of defect sources in semiconductor fabrication. With its modular architecture and advanced capabilities, KLA Archer 100 significantly reduces the time and cost associated with traditional inspection and defect classification techniques, providing users with confidence in their product quality. The system features a unique correlative optical microscope, CropScan™, that combines automatic die-by-die scrolling and the industry's best low magnification imaging capability to quickly and accurately classify defects within the same view used for automatic inspections. The unit also utilizes the advanced GVision™ image acquisition and analysis machine to detect defects and classify them as critical, non-critical, or no-defect to provide product assurance at all stages of the semiconductor process flow. TENCOR Archer 100 enables users to capture detailed die images of up to 8" wafers with up to 32K resolution, allowing for high-definition identification of defects down to a few microns. Automated pattern matching enables the tool to identify and mark even the smallest and faintest defect, as well as automatically reject or accept masks/wafers based on criteria set by the user. To ensure easy and intuitive operation, Archer 100 features a touch-based graphical user interface that allows users to easily control the asset and design new recipes quickly. The software also includes powerful data management and report generation functionality to ensure the traceability and repeatability of fabrications. KLA / TENCOR Archer 100 can be integrated into an existing workflow and is compatible with a range of semiconductor fabrication and metrology instruments, providing users with an ever-expanding ecosystem of solutions for the semiconductor manufacturing industry. With its low failure rate and easy installation process, this model is designed to provide users with a reliable and cost-effective solution for mask and wafer inspection.