Used KLA / TENCOR Archer 500 LCMu #293668510 for sale
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ID: 293668510
Wafer Size: 12"
Vintage: 2016
Overlay measurement system, 12"
Does not include Hard Disk Drive (HDD)
2016 vintage.
KLA / TENCOR Archer 500 LCM is a leading vendor in the mask and wafer inspection industry. It is a lithography module specifically designed to detect yield-impacting defects at the key stages of the fabrication process. The equipment is designed to provide a comprehensive inspection solution that combines the highest levels of reliability, accuracy, and efficiency to meet the most demanding applications. At the heart of the system is the patented arc examination technology which is capable of detecting defects at a resolution level of less than 0.4 μm. The advanced optical unit of the Archer 500 allows the machine to exams surface defects, particles, local stains, and other features simultaneously on both mask and wafers. In addition, the tool's superior Defectivity and Tolerance Index (DTI) capability lets customers accurately classify and detect yield impacting defects earlier in the process. The Archer 500 is supported by two modules, the Optical Column Module (OCM) and the Image Analysis Module (IAM). The OCM is responsible for capturing the images of the sample, while the IAM is used for processing the images and providing the detailed analysis results. By combining these modules, the Archer 500 can be used to cover a wide range of inspection scenarios. The advanced technology of the asset allows it to handle the demanding high-speed, high-resolution, and high-throughput requirements of mask and wafer inspection. The model is also designed for easy integration into the existing production equipment. It features a wide range of user-friendly features, including remote controllability, data exchange capability, and advanced diagnostics tools. In addition to the physical inspections, the Archer 500 offers a variety of diagnostic capabilities for analyzing the performance of process recipes. It can provide a detailed analysis of the results by combining the inspection results with process data, allowing users to quickly identify and eliminate potential defects in order to maximize efficiency and yield. Overall, KLA Archer 500 LCM is a powerful tool for mask and wafer inspection. It offers an advanced feature set which delivers high-speed and high-accuracy defect detection capabilities, allowing users to optimize yield, prevent costly scrap, and significantly reduce the labor costs associated with manual inspection.
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