Used KLA / TENCOR Archer AIM Plus #9023783 for sale
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KLA / TENCOR Archer AIM Plus is an advanced mask and wafer inspection equipment used in the semiconductor manufacturing process. The system is capable of identifying defects in mask or wafer fabrication of integrated circuits, including those related to lithographic printing, metrology, and planarization. It is the only unit of its kind capable of automatically detecting and accurately measuring nanoparticles and other non-lithographic defects. KLA Archer AIM Plus is an automated, integrated unit consisting of several subsystems. These include an automated optical inspection machine (AOI) to identify lithographic and non-lithographic defects, a high-resolution microscope for measuring small defects, and a metrology tool to measure parameters such as linewidth deviations. In addition, the asset includes an advanced data analysis and visualization toolkit to analyze the images obtained by the inspection model in order to identify, assess, and prevent yield-limiting issues. The AIM Plus is designed to provide high-accuracy, non-destructive inspections that enable the rapid detection and measurement of defects as small as 3nm, thereby improving the yield of semiconductor devices. In addition, the equipment is capable of detecting particles, uniformity, and other non-lithographic characteristics that could otherwise go undetected. The advanced metrology capabilities of the AIM Plus provide precise control over critical nanoelectronic photolithography processes, such as patterning and lithographic edge placement. The AIM Plus is extremely fast and reliable, enabling it to evaluate a full 8 inch wafer in a single pass, in as little as 25 seconds. Furthermore, the system's user-friendly interface ensures an easy-to-operate unit, which reduces the time and cost of operation and maintenance. With its powerful computing abilities, the AIM Plus is capable of transferring large amounts of data quickly and securely, providing valuable insights to production optimizers in real-time. Overall, TENCOR Archer AIM Plus is an advanced and powerful solution for mask and wafer inspection, enabling improved yield and low cost of production in semiconductor fabrication. It is highly versatile with advanced features and capabilities, making it a reliable solution for quality control and process monitoring.
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