Used KLA / TENCOR Archer AIM #9104741 for sale

KLA / TENCOR Archer AIM is a groundbreaking mask and wafer inspection solution that combines high-end technology with an easy-to-use interface for reliable and accurate analyses. This system is certainly well suited for IC manufacturers who need to assess masks that are essential in their production of integrated circuits. The platform features extremely precise optical imaging technology to capture detailed structures on the surface of a mask or wafer. It takes advantage of the latest algorithms for faster and more reliable investigations, enabling users access to detailed analysis results in no time. Installation and setup is also made simple, as KLA Archer AIM is designed with plug-and-play components that can be quickly configured and set up. TENCOR Archer AIM enables users to inspect small and complex structures while measuring a variety of characteristics in a reliable and accurate manner. The platform can provide a vast array of high-definition images, providing an accurate account of the product's surface properties. It can detect defects at the nano-level, assess critical dimension (CD) layers, and calculate shrinkage and overlay. Archer AIM offers a fast and efficient workflow for consumers, with innovative automation and data collection tools for analyzing accuracy in a time-efficient manner. It includes a wafer map reconstruction tool that enables users to easily view process defects from all layers of the wafer substrate. As well, the platform can quickly locate and identify signature defects. KLA / TENCOR Archer AIM easily integrates with any existing tool sets, providing an optimized solution for repeatable process control. The system can also be configured to control a wide range of functions, including advanced analytics and pattern recognition. By integrating KLA Archer AIM with a comprehensive storage solution, users can automatically store and access data for improved traceability. Overall, TENCOR Archer AIM is a powerful, reliable, and trusted mask and wafer inspection solution that helps to ensure precision and accuracy in IC production process. It features a simple, easy-to-use interface, rich data sets, and optimized software that make it a valuable tool for any modern IC manufacturer.