Used KLA / TENCOR Archer AIM #9173737 for sale

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KLA / TENCOR Archer AIM
Sold
ID: 9173737
Overlay inspection system Specifications: 12" With dual FOUP for dram and NAND Fully automated overlay measurement module: Coherence probe Interference microscope Automated wafer handling Software: Windows XP based SW and User Interface Integrated user interface Includes: 19" LCD Screen 3.5" Floppy drive CD ROM Drive Tape drive back up system (DAT) Video hard copy printer Network: RJ45 (10 Base-T) and BNC and AUI connectors Tool options: Electrical wiring EMO Shield Archer 02S & 03 painted skins CMP Measurement (CPM+ANRA) Signal tower: (4) Lamps 40mm Currently de-installed.
KLA / TENCOR Archer AIM is a powerful mask and wafer inspection equipment which is designed to help both foundries and their customers enhance their manufacturing process. The system consists of a high power laser, advanced optics, and a sophisticated imaging unit. This combination enables the machine to detect and identify defects quickly and accurately, making it invaluable for a variety of applications such as semiconductor mask and wafer inspection, LCD/CNT mask inspection, and MEMS device inspection. The high power laser is the first component of the tool and is used to generate an intense light beam. The beam is finely tuned so that when it is directed at a wafer or mask, it illuminates different features of the product. The beam is able to detect small defects such as missing coatings, edges, surface features, and more. The sophisticated optics enable KLA Archer AIM to inspect different products in detail. The optics precisely polarize and disperse the laser beam so that it can identify fragile single-etch structures, both on the mask and wafer. It can also locate improper registration and/or poor bonding at the seams of the product, with enhanced detection capabilities. The asset's imaging model is composed of CCD line cameras which capture the image of the product with each line scan. The captured picture is passed through a defect management equipment which identifies the defects with its advanced algorithms. Any detected defects can then be flagged before the product enters the production line. In addition to its inspection capabilities, TENCOR Archer AIM also offers in-line metrology solutions for a wide range of products. These metrology measurements can be read directly on the monitor during inspections, allowing for quick and easy quality control. To make the most of Archer AIM system, users can utilize various reporting and workflow management tools. This helps to ensure that results are accurately tracked and maintained in a central database. In conclusion, KLA / TENCOR Archer AIM is a robust, reliable, and accurate mask and wafer inspection unit. It is capable of detecting and identifying defects quickly and precisely, making it ideal for a variety of applications. The machine also offers in-line metrology solutions and other features to help users streamline their production process.
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