Used KLA / TENCOR Archer AIM+ #9198841 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
KLA / TENCOR Archer AIM+ is a comprehensive inspection equipment designed for the automated and reliable high-speed detection of defects in high aspect ratio (HAR) masks, wafers, and other flat objects. With its advanced optical inspection system, it provides customers with a wide range of functionalities, from inspecting for both surface and 3D defects, as well as dual-side defect and package feature inspection, enabling quick and accurate testing of HAR technologies. The unit is designed for high-throughput mode and is capable of scanning a large area in a relatively short amount of time. It features two heads that can accommodate both UV and visible light sources and two cameras, each with a roll-off machine and a 'dark field' measuring lens. The tool also includes a high-resolution imaging sensor and up to four optional optics to meet specific customer needs. KLA Archer AIM+ is powered by built-in search and detection algorithms, which can be tailored to detect any kind of defect or package feature, such as wafer line-edge defects, package warpage and micro-bend, wafer micro-cracks, discoloration and line-width issues, and micro-breakage on mask-level defects. The asset's automated defect and package feature detection model can detect a wide range of surfaces, shapes, and sizes, making it an ideal solution for demanding mask and wafer inspection requirements. TENCOR Archer AIM+ equipment is also equipped with a 3D 'stack viewer', which allows customers to further analyze and identify any defects, package features, and more. Additionally, the system comes with a 'duty cycle' feature, which helps increase throughput, as well as reduce inspection cycle times. Finally, the unit provides an advanced data logging and analysis machine, providing customers with detailed defect and package feature data. In summary, Archer AIM+ is an automated and reliable high-speed defect and package feature inspection tool ideal for demanding mask and wafer inspection requirements. The asset is equipped with advanced optical, imaging, and detection technologies, as well as powerful analysis and data logging tools that provide customers with detailed defect and package feature data. The model is a valuable asset for any high-speed, high-throughput inspection process.
There are no reviews yet