Used KLA / TENCOR Archer AIM+ #9202700 for sale

KLA / TENCOR Archer AIM+ is an automated mask and wafer inspection equipment used by semiconductor manufacturers to ensure the quality and accuracy of the production process. The system uses advanced imaging and analytics algorithms to detect defects on the mask, wafer and process layers of a semiconductor device. KLA Archer AIM+ unit is built on five separate components: PixelTRAK 1000, SiliconVision XR, ProcessVerify, GEMIN3 and IMAGE. Each component has unique features to streamline the mask and wafer inspection process and deliver accurate results. PixelTRAK 1000 is an image acquisition machine that can bridge the performance gap between manual and automated inspection processes. The tool includes a CCD camera to capture high-resolution images of the mask or wafer that is fed into the asset from a flat panel, roller-base or semiconductor-carrier. The images can be modified and referenced for all possible defects and combination of inspections, like defect detection type, camera angle, and image windowing. SiliconVision XR is a powerful image analysis tool designed to generate more detailed and precise information about defects on the mask or wafer. The platform utilizes pattern recognition algorithms, 3-D imaging and machine learning technology to efficiently identify surface, chip and device defects. ProcessVerify is an integrated review platform that was designed to boost productivity and reduce operational costs. The technology allows companies to keep track of all the changes that occur during the inspection process, including defect locations, defect classifications, and automated actions. GEMIN 3 is a measurement model designed to measure and analyze the surface shape of extended features at different stages of the production and inspection process. The equipment is capable of measuring objects with a depth range of up to 5m and a field of view as wide as 10.7mm. Finally, IMAGE provides automated defect inspection and classification capabilities that can be used to guarantee the quality of products. The system is equipped with specialized algorithms to identify patterns, wrinkles, cracks, dust, and any other type of irregularities. With the help of Artificial Intelligence, the unit can provide in-depth analysis and detailed defect data. TENCOR Archer AIM+ kit is a powerful and easy-to-use machine for mask and wafer inspection. It offers a variety of features for defect detection, image analysis and process control, making it an ideal choice for semiconductor manufacturers.