Used KLA / TENCOR Archer AIM+ #9237501 for sale

KLA / TENCOR Archer AIM+ is an advanced mask and wafer inspection equipment designed to provide enhanced process control, yield improvement and error reduction. The system provides unprecedented resolution, sensitivity and speed in detecting defects. The unit consists of an advanced optical design with a high-resolution camera, an image processor, and a proprietary algorithm to analyze images. This combination of advanced technologies enables the machine to detect defects as small as 25 nanometers in size. The tool is able to reveal critical pattern defects that may otherwise go undetected, making it ideal for inspecting the most critical layers for accuracy and precision. The asset is designed to minimize operator interaction and to simplify the inspection process. Its Graphical User Interface (GUI) offers ease of use and intuitive access to all settings and components, allowing for quick and accurate setup and real-time adjustments. The model is fully automated and can be set to run unattended, if desired. The equipment can detect not only defects on masks and wafers, but also variations in critical parameters such as critical dimension (CD) and line width of patterns. It helps ensure failure-free operation by flagging any variations that may alter performance. The system also provides comprehensive data collection and analysis software, enabling users to store and retrieve data, run analysis and monitor processes. The unit's reporting module automatically compares results against user-defined criteria, making it easy to identify areas of improvement. The machine's unique combination of features helps to ensure the highest quality masks and wafers. It also helps save time and resources while providing a higher yield and improved performance compared to conventional inspection systems.