Used KLA / TENCOR Archer AIM #9293250 for sale

KLA / TENCOR Archer AIM is an automated inline mask and wafer inspection equipment that provides high-level performance for yield management, defect dispositioning and device qualification. The system features an inspection head with a 4k pixel detector array, which delivers high-resolution inspection for detecting small defects. The optical unit is combined with powerful image processing and defect detection algorithms to provide the highest defect detection accuracy. The machine includes a unique auto-optimization process that allows users to customize the tool for their specific applications and improve the detection sensitivity. In addition, the asset supports both automated and manual defect review, providing a comprehensive and comprehensive solution. The model is also equipped with a defect review station, allowing users to quickly and easily identify and classify defects. The complimentary advanced software package provides virtual review, allowing users to compare the original device data to the results of the inspection process. The software also provides defect classification library, enabling users to develop and store custom defect list suitable for their specific process. The equipment ensures a fast and accurate defect identification through the integration of various advanced inspection and fault-finding techniques. The system uses a scanning electron microscope (SEM) unit with advanced automated measurement capabilities, allowing for fast and accurate defect size and defect location identification. It also includes a CD-SEM machine which relies on charge-coupled device (CCD) technology for higher-resolution images. The CD-SEM tool is integrated with a 3D high-resolution stereo microscope for defect classification applications. Furthermore, the asset can be integrated with a variety of advanced metrology systems for defect classification. The model includes a equipment-wide security network, consisting of secure parameters, authentication mechanisms and a comprehensive system log, that ensure the utmost protection of quality requirements. The unit also enables users to access review and analysis tools remotely, providing users with the ability to discuss and review issues quickly. Finally, the machine is designed to improve process efficiency, increase throughput and reduce false rejects. The tool provides users with highly sensitive and accurate inspection results, as well as shortened detection times. The asset also produces detailed defect report summaries directly to process engineers and operators, simplifying the review process. All of these features and benefits make KLA Archer AIM an ideal mask and wafer inspection model.