Used KLA / TENCOR Archer XT+ #117108 for sale

KLA / TENCOR Archer XT+ is a type of mask and wafer inspection equipment that is used for inspecting defects in the circuitry of integrated circuits and semiconductor packages. This system is ideal for the inspection of nanometer structures, as it features a special configuration that provides a highly sensitive optical platform. Furthermore, the unit boasts two efficient interferometers, one to inspect the visible light and the other to inspect the near infrared (NIR) range. This provides an extended depth-of-field compared to conventional microscopes, leading to a greater level of accuracy in the inspection process. The machine utilizes light waves that pass through the nanometer structures of the circuits and devices, allowing for a thorough evaluation. Through the use of automated image processing, the tool is able to compare the objects and detect any defects, such as line-edge roughness or continuous breaks. In addition, the asset also offers advanced features such as an adjustable zoom magnification, enabling detailed analysis and characterization of small features. KLA Archer XT+ is equipped with intuitive software, which allows the user to adjust various parameters such as the sensitivity, area of inspection and image acquisition. The model also provides the user with several visualization techniques, such as the overlay and false color imaging options. This helps the user to quickly detect any defect. The equipment's design allows for rapid and easy setup, making it an excellent choice for industrial applications. In addition, the system can be connected to other systems and machines, in order to enable efficient automation of inspection tasks. TENCOR Archer XT+ also provides advanced fraud and counterfeit detection capabilities, allowing for a secure and reliable unit of data security and traceability. Archer XT+ is one of the most advanced systems available for mask and wafer inspection, and its excellent performance and features make it an ideal choice for inspecting nanometer structures. With its reliable detection capabilities and intuitive software, KLA / TENCOR Archer XT+ is sure to provide outstanding results in a wide range of inspection processes.