Used KLA / TENCOR Archer XT #9165076 for sale
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ID: 9165076
Wafer Size: 12"
Vintage: 2006
Overlay measurement system, 12"
2006 vintage.
KLA / TENCOR Archer XT is an industry-leading mask & wafer inspection equipment designed for advanced process control in semiconductor fabrication. This technology is used in the production of integrated circuits and other related products, and it features high resolution imaging and pattern recognition capabilities. The system is capable of identifying defects down to the level of one micron and provides the industry's most advanced visuals and defect analysis capabilities. It has the capability to perform rapid in-line, pre- and post-etch inspections of semiconductor devices, as well as detailed multi-level mask inspections and thin-film metrology. KLA Archer XT is equipped with proprietary dual-layer imaging that utilizes a unique combination of pattern recognition algorithms and high-resolution images. This combination of imaging and defect detection technology is what sets the unit apart from other comparable options on the market. TENCOR Archer XT uses two adjustable imaging systems to capture both high resolution 'top view' images at the wafer level and low resolution 'bottom view' images at the mask level. It is also able to generate detailed defect reports, allowing the user to analyze potential defect sites and understand their origin or base cause. Archer XT is also capable of generating a variety of complex graphics which can show trends in the development of a given fabrication process over time. It is this type of analytics that makes KLA / TENCOR Archer XT the perfect choice for keeping the advanced process control needs of a semiconductor fabrication machine up-to-date. KLA Archer XT's combined capabilities make it a versatile and reliable mask & wafer inspection tool for any environment. The asset is also designed for easy integration with existing fabrication processes and is designed to be backwards compatible with other KLA products. This means that the model operates in the same way with newer generations of the product line as it does with the original systems. Using TENCOR Archer XT can streamline the process control requirements for a fabrication line and significantly improve the odds of producing a highly actionable set of defect analysis data. The data analytics can be used to take a proactive approach to process control, avoiding costly and time consuming corrective processes. Overall, Archer XT is an advanced mask & wafer inspection equipment that provides best-in-class defect analysis capabilities, detailed graphics, and rapid in-line pre- and post-etch inspection. This system facilitates advanced process control and allows users to stay ahead of any potential defects. KLA / TENCOR Archer XT is a powerful tool for any semiconductor fabrication environment, providing the necessary capabilities to stay competitive in the ever-evolving world of integrated circuit production.
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