Used KLA / TENCOR Archer XT+ #9365760 for sale

KLA / TENCOR Archer XT+ is an advanced mask and wafer inspection equipment that offers complete, industry-leading parallel inspection coverage. KLA Archer XT+ is designed for wafer-level inspection applications and features a high-resolution color camera that captures complete images of mask wafers over its large field of view with high accuracy. The inspection system is ideal for use in the production of advanced mask and wafer devices, as the XT+ provides fast and efficient inspection of entire functional areas. The XT+ uses advanced inspection algorithms and scanning hardware to detect defects on both plastic and glass masks and wafers simultaneously, with unparalleled speed and accuracy. TENCOR Archer XT+ also includes a suite of specialized software tools that provide additional levels of accuracy and performance. The unit is optimized for mask and wafer production applications, and offers a unique set of features designed to meet the highest accuracy requirements. Archer XT+ is equipped with a high-resolution, full-color camera that captures complete images of mask and wafer surfaces, over a large field of view. The XT+ includes a range of pattern detection, measurement, visualization and analytics tools, to help quickly identify and analyze defects over entire surfaces. The machine's flexible inspection technology delivers quick and reliable results across different substrate materials, and features a variety of visual aids and metrics to help users identify discrepancies quickly. KLA / TENCOR Archer XT+ is designed to provide robust inspection performance and coverage over large fields of view. The tool features an active imaging asset, which targets the entire field of view with laser illumination, eliminating the need for scanning. A long-life imaging geometry ensures consistent performance over time and enhances defect detection accuracy. KLA Archer XT+ is also equipped with advanced sensors that enable measurement of surface topography, which is used to recognize and classify small defects including pits, cracks, and pinholes. The XT+ is optimized for performance and ease of use, with an intuitive user interface, efficient workflow options and an easy-to-navigate library of sample images and data. The software also offers powerful analytics and reporting abilities, enabling users to optimize model performance and analyze results. TENCOR Archer XT+ is built to last, with a compact footprint and durable construction. It is an ideal solution for detecting defects in mask and wafer materials, offering a comprehensive, high-resolution inspection solution.