Used KLA / TENCOR Archer XT+ #9374830 for sale

KLA / TENCOR Archer XT+ is an innovative mask and wafer inspection equipment that offers advanced automated, high-precision, and 360-degree imaging technology. This system utilizes a full-field inspection (FFI) combined with software-based image processing to facilitate rapid inspection of wafers and masks. The FFI provides high resolution and high contrast imaging capabilities that can easily detect defects of all sizes. This unit also features a wide array of powerful features to ensure that any flaws, contamination, or other defects can be quickly and accurately detected. KLA Archer XT+ allows users to monitor the quality of the wafer and mask surfaces in real-time, making it an ideal choice for inspecting many different wafer and mask applications. The machine includes a high-speed wafer AutoMapping tool that provides a real-time mapping of the area being inspected. The asset also utilizes a dual wavelength illumination model, which is optimized for various materials and process steps. This equipment also uses an advanced defect detection and classification algorithm which helps identify, locate, and classify defects and other contaminants. This is done utilizing image contrast pattern recognition algorithms and powerful laser exact pattern fusion techniques. This allows users to quickly identify the severity and type of defect or contamination. TENCOR Archer XT+ also offers a variety of modes for defect and contamination classification. These include custom defect inspection profiles, single point detection, and multi-point defect ranking modes, which ensure that any flaws or defects that are detected can be quickly and accurately identified. The system also includes a variety of comprehensive defect reporting options which allow users to quickly and efficiently create reports that summarize defect inspection results and other related information. This unit is capable of accommodating a variety of wafer and mask types including lithographic and CMP wafers and masks. Archer XT+ is an innovative and powerful machine for mask and wafer inspection that offers a unique combination of advanced imaging, inspection, and defect classification capabilities. This tool is capable of detecting and successfully classifying even the smallest defects and contaminants, making it an ideal choice for any application requiring reliable and accurate inspection.