Used KLA / TENCOR Archer #9199198 for sale

KLA / TENCOR Archer
ID: 9199198
Overlay inspection system.
KLA / TENCOR Archer is an automated, high-magnification, mask and wafer inspection equipment that is designed for semiconductor manufacturing processes. It uses advanced optics and image processing technology to detect and characterize defects on processed mask and wafer substrates. This system accurately inspects semiconductor wafers and masks for a range of defect types such as line and dot patterning, stress, debris, non-uniformly filled interfaces, and non-uniformly developed structures. It can also measure electrical properties of fixed pattern structures. The unit consists of two components: an imaging machine and an inspection head module. The imaging tool includes a large-area CCD (Charge-Coupled Device) for capturing defect images. Additionally, a high-resolution microscope provides an optical image for accurate defect location and identification. An adjustable illumination asset enables the model to create next-generation masks that have tighter tolerances and more complex patterning. The inspection head module includes a special defect measurement subsystem, which uses automated algorithms to calculate defect characteristics. The module is integrated with an accurate alignment subsystem which helps to make sure that line and pattern features on the wafer and mask can be compared and properly aligned. KLA Archer equipment is designed for superior reliability and repeatability, enabling fast and precise inspection and measurement. It is designed with flexible automation solutions that will reduce the cost and increase the throughput of semiconductor inspection processes. The system's capabilities provide a high-quality solution to help semiconductor manufacturers detect and isolate critical defects quickly and accurately. This helps achieve superior yields and improved quality for devices manufactured with improved processes and materials.
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