Used KLA / TENCOR Candela 7100 #293609267 for sale

ID: 293609267
Vintage: 2010
Optical surface analyzer 2010 vintage.
KLA / TENCOR Candela 7100 is a mask and wafer inspection equipment designed to check quality and deliver detailed analysis of mask and wafer geometry. This system is effective in detecting yield-critical defects and enables high-accuracy review of mask and wafer geometry. KLA Candela 7100 is a mask and wafer inspection unit that combines high-resolution imaging, light source scanning and advanced optical systems to inspect defects on masks and wafers. This machine supports multiple light sources with wavelengths ranging from UV to near-infrared, and its multi-sensor technology maximizes sensitivity and efficiency. TENCOR Candela 7100 offers high speed and high resolution imaging, with a zoom capability that enables the user to focus on important features with defocused regions for a wide field of view. The tool features an automated focus control for improved accuracy and repeatability, and an integrated spectral filtering asset that helps identify defects. The model incorporates a palette of routines for defect inspection; in particular, the equipment can be programmed to identify contrast defects and inspect for tilts, uneven wafer surfaces, particle stains, and other contaminant features. The system can be used for both front- and backside inspection, and includes specialized lighting modules to improve imaging contrast and sensitivity. The automated measurement routines of Candela 7100 enable fast, accurate and reliable measurements of critical parameter variations to the 1000th of an inch. The unit also supports software-based sorter and metrology capabilities, helping to quickly identify and quantify acceptable and unacceptable defects. In addition to its detection and metrology capabilities, KLA / TENCOR Candela 7100 is customizable and upgradeable, allowing users to configure the machine to meet their specific mask and wafer inspection needs. The tool's long-term stability and reliability ensure accuracy throughout the entire inspection process. In conclusion, KLA Candela 7100 is a reliable and advanced digital mask and wafer inspection asset that utilizes high-resolution imaging, light source scanning and advanced optical systems to identify defects. The model is designed to provide efficient, fast, and accurate results, and the customizable and upgradeable nature of the equipment ensures that the system can be tailored to any inspection needs.
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