Used KLA / TENCOR Candela CS20 #9262810 for sale

KLA / TENCOR Candela CS20 is a mask and wafer inspection equipment. This system combines the strengths of the latest KLA software and hardware to provide science-backed accuracy, precision, and reliability. The unit incorporates a high throughput, high-throughput, short-wavelength CCD camera to capture all the features of a wafer and mask in one, automated easy-to-use machine. The CS20 also features an industry-leading automated defect classification tool to provide results in real time. KLA CANDELA CS-20 is an industry-leading scanning and inspection asset that enables inspection and metrology of nanometer-scale structures. It includes a high-throughput CCD Camera, Automated Defect Classification (ADC) model, a high-resolution microscope, pre- and post-scan tools, and an intuitive graphical user interface (GUI). This equipment provides a complete solution for wafer and mask inspection and analysis, with the ability to handle tasks from simple to complex. TENCOR CANDELA CS 20's CCD Camera uses short-wavelength infrared and visible imaging technology to accurately identify, measure, and classify defects on subsurface and surface layers. Because the camera can discriminate between resolution levels, the user is assured of accuracy regardless of the scale of the feature. This system also features an Automated Defect Classification (ADC) unit to instantly detect and classify defects in real time. All results and inspection parameters are automatically saved in a non-volatile memory location, and a summary report can be quickly generated with a few clicks. CANDELA CS-20 also has a built in advanced microscope to inspect smaller than 1 micron features. This machine uses advanced lighting and optics to accurately focus and provide advanced visualization of features. The tool is offered with a range of optional upgrades, with the capability to profile jitter, provide particle characterization, and check for background radiation. This asset allows for inspection of a variety of wafers and masks in a variety of sizes and configurations. KLA / TENCOR CANDELA CS 20 includes an intuitive GUI and pre/post scan tools for easy image analysis and defect classification for human eyes. Results generated by this model are in a proprietary, cross-platform-friendly format and can be exported to other programs for further use. The GUI also integrates with 3D characterization software for mask pattern verification and alignment, providing easy access to critical process control data. Overall, Candela CS20 is the industry-leading mask and wafer inspection and metrology equipment, giving it a decisive advantage over less-advanced systems. The CS20's combination of speed, accuracy, and versatility enables it to deliver high-quality results quickly and efficiently, and its wide range of capabilities make it ideal for both research and industrial application.