Used KLA / TENCOR CRS 2000 #293595655 for sale

KLA / TENCOR CRS 2000 is a mask and wafer inspection equipment designed to detect m any types of defects. It functions by utilizing brightfield and darkfield illumination in 4 separate angles to provide a complete view of the entire surface area of a wafer or mask. The system then stores images of each defect, providing detailed information on the exact size, nature, and location of each defect. In addition, KLA CRS 2000 can also provide detailed reports on the number and size of each defect found and can detect contaminants in samples. TENCOR CRS 2000 provides various task-specific viewing modes with the ability to customize parameters. These include Brightfield and Darkfield modes, where both modes can be used to detect surface topography. Sub-micron defect detection is enabled by a special Zoom mode, which can zoom in to resolutions of up to 5000x. CRS 2000 also features advanced algorithms for the identification of particles, contaminants, and edge defects. Furthermore, automated scanning and inspection makes it possible for the unit to rapidly scan up to 170 wafers in less than an hour. For users, KLA / TENCOR CRS 2000 includes a comprehensive software package to control the machine, process and analyze data, as well as a user-friendly graphical interface to access all the functionalities. This interface includes data logging, report generation, alarm setting, and mask editor. KLA CRS 2000 also supports data transfer to and from other KLA systems for easier inspection and review. All results can be presented in statistical tables, or exported to a standard ASCII format. The tool's advanced MultiTask software package also provides advanced analysis functions such as area, density, roughness, and slope detection. Built-in algorithms are used to sort and group defects according to various criteria and enable fast and accurate determination of defect locations. In addition, this software can also generate comprehensive reports including statistical summaries and other detailed information. TENCOR CRS 2000 is an ideal tool for applications that require detailed measurements of wafers and masks. It provides accurate detection of defects and contaminants of all sizes and locations, as well as comprehensive reporting and analysis functions. With its easy-to-use operator interface, CRS 2000 is a reliable and cost-effective mask and wafer inspection asset.