Used KLA / TENCOR eS30 #9083787 for sale

KLA / TENCOR eS30 is an advanced mask and wafer inspection equipment that provides customers with a dependable and reliable tool for inspecting semiconductor masks and wafers. This system delivers advanced imaging and defect detection capabilities for quickly spotting and analyzing any type of surface or pattern defects in wafers and masks. With its integrated automated defect classification unit, KLA eS30 helps in efficiently separating true defects from randomly occurring features, allowing users to easily identify if their products are of acceptable quality. TENCOR eS30 provides high-resolution imaging that goes beyond traditional techniques, with a resolution of 5nm, making it ideal for inspecting the very detailed features of mask and wafer patterns. The machine also offers noise and blur reduction features to ensure that the images are as sharp and clear as possible. ES30 comes with a range of 2D image processing algorithms designed for fast and accurate defect detection. These algorithms search for points, lines, edges, and other characteristic features of the masks and wafers. The advanced defect management capabilities built into KLA / TENCOR eS30 allow users to download detailed defect reports that can be used to monitor defect trends and ensure they remain in a controlled state. This tool also provides integrated data analysis and reporting on the overall defect log. In addition, KLA eS30 is equipped with a range of automated functions designed to boost production throughput. It offers in-situ mask measurement, quick setup times, batch processing, and simple job programming for improved cycle times and productivity. Overall, TENCOR eS30 is a powerful mask and wafer inspection asset that delivers unprecedented accuracy and performance for semiconductor mask and wafer inspection. With its advanced imaging capabilities, feature detection algorithms, and defect management tools, eS30 is the ideal solution for any customer looking for dependable and reliable mask and wafer inspection.