Used KLA / TENCOR eS32 #9398361 for sale

ID: 9398361
E-Beam inspection systems 2005-2006 vintage.
KLA / TENCOR eS32 is an automated optical inspection equipment used to inspect semiconductor masks and wafers. It is capable of 10-micron imaging resolution, allowing it to detect a variety of defects, including critical dimensions (CD), line width variations, misalignments, scratches, pinholes, particulates, stains and other process-induced defects. KLA eS32 supports both brightfield and darkfield imaging, enabling the user to detect the smallest defects on both transparent and opaque surfaces. TENCOR ES 32's advanced, high-resolution camera is equipped with a 5-megapixel sensor and a 16mm twin lens design to enable maximum accuracy in detecting minute features on a wide range of substrates. The camera is capable of capturing images at speeds up to 100 frames per second and exposes the wafer with an ultra-short pulse laser for significantly reduced blur. Additionally, KLA ES 32's multiple inspection modes, including brightfield, darkfield, and combined brightfield-darkfield, provide users with comprehensive defect coverage. In addition to its powerful imaging capabilities, KLA / TENCOR ES 32 also features several advanced intelligence features. These include a built-in image analysis algorithm for optimized defect detection accuracy and a proprietary Auto Defocus Correction system for automatic, reliable image focus. The unit's user interface is intuitive and user-friendly, with a touch-sensitive monitor that allows for easy examination of images and quick data analysis. ES32 is built on a modular platform, enabling users to customize the machine to fit their specific semiconductor inspection needs. Its highly accurate, low-profile vision systems are capable of performing both high-speed inspections and scan-and-measure tasks. Additionally, the tool's advanced algorithms and tight tolerances improve visual detection, lessen downtime, and provide a stable, reliable inspection experience. Overall, TENCOR eS32 is an excellent automated optical inspection asset for semiconductor masks and wafers, due to its advanced imaging technologies, intelligent features, and customizable modular platform. It is designed to allow for quick and reliable defect detection, maximizing yield and product quality.
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