Used KLA / TENCOR eS35 #9236715 for sale

KLA / TENCOR eS35 is an advanced mask and wafer inspection equipment designed to detect and correct critical defects on semiconductor masks and wafers. KLA eS35 offers superior flexibility and speed, allowing it to make quick, accurate decisions without risking yield or precision. This integrated imaging solution combines a high-powered laser source, image correction algorithms, and advanced defect management software to provide a comprehensive inspection system for the semiconductor industry. At its core, TENCOR ES 35 consists of a large-area, high-resolution aerial image sensor, an optics unit, an integrated laser source, and an advanced defect-correction algorithm. The laser source emits an intense beam of light which is reflected by the wafer or mask under inspection. This beam of light is detected by the high-resolution aerial image sensor and is run through the optics machine. The optics tool allows for extremely precise measurements of the mask or wafer's shape and surface topography. The defect-correction algorithm is then used to compare the image data with a reference image, and any errors are identified and corrected. TENCOR eS35 is capable of detecting defects down to 0.004 microns and can measure up to 10 different layers from a given mask or wafer. This is done using a superior signal-to-noise ratio and a high dynamic range, resulting in an exceptional image quality. ES35 is equipped with a fully automatic process monitoring asset, which can validate the mask or wafer's design at a very early stage and monitor any changes that may occur while processing. KLA ES 35 can also be used to measure specific features on mask or wafer that are not visible to the naked eye. It is capable of measuring features as small as 0.008 microns, and it can also detect defects that are invisible to the human eye. This included but is not limited to defects which may arise from contamination, non-uniform contacts, faulty wiring and more. ES 35 also provides users with an array of productivity tools such as defect tracking, wafer management, and a digital defect library. All of these are particularly helpful during the validation procedures, ensuring that the mask and wafer passes quality assurance and product integrity standards. Overall, KLA / TENCOR ES 35 is an invaluable tool for quality assurance in the semiconductor industry and is a great addition to any manufacturing process. By combining high-powered laser sources, high-resolution aerial imaging and advanced defect-correction algorithms, it provides an integrated imaging solution with unparalleled accuracy and speed.