Used KLA / TENCOR EV300 #9019927 for sale

KLA / TENCOR EV300 is a mask and wafer inspection equipment designed for use in the semiconductor industry, specifically for high-resolution mask and wafer inspection. The system combines KLA wafer inspection technology and TENCOR mask inspection technology, providing customers with a comprehensive, high-performance inspection solution. KLA EV 300 is one of the fastest and most powerful mask and wafer inspection systems available, due to its integrated hardware and software. The unit has a maximum scanning speed of 17.4 μm/sec, allowing for fast, efficient inspection. It is also equipped with an advanced optical imaging machine and laser-illuminated inspection head, allowing it to detect microscopic defects with unparalleled accuracy and sensitivity. Additionally, the tool is equipped with a patented focus control asset, allowing it to scan a broader range of materials with more accuracy than ever before. TENCOR EV-300 model has a user-friendly interface, which enables the user to quickly and easily access and control various inspection functions, such as selection of image defects to be inspected, scan layouts, parameter settings, and calibration modes. Furthermore, the equipment is capable of executing multiple scans simultaneously, allowing for faster results. With its intuitive user interface and expansive capabilities, the system can help semiconductor manufacturers save time and money while achieving maximum accuracy and performance. EV300 also comes with a powerful image analysis software package, providing easy-to-use defect identification and classification tools. The software also supports scripting, allowing for complex defect analysis and auto-classification. Additionally, the unit has built-in calibration functionality, allowing it to automatically adjust to changing environmental or substrate conditions. KLA EV300 machine provides a comprehensive, high-performance mask and wafer inspection solution with unequaled speed, accuracy, and sensitivity. Its integrated hardware and software, user-friendly interface, fast scanning speed, advanced optical imaging tool, laser-illuminated inspection head, and powerful image analysis software package make it an excellent choice for any semiconductor manufacturer.