Used KLA / TENCOR / ICOS CI-T120 #293758434 for sale

KLA / TENCOR / ICOS CI-T120 is a mask & wafer inspection equipment that combines a suite of advanced inspection technologies to provide industry-leading imaging capabilities. The system uses Digital Metrology technology to capture detailed images of patterns at the photomask, reticle and wafer level. This allows accurate measurement and inspection of these devices on individual chips, as well as on a global level. The unit is equipped with a Mask and Photo Defect Acquisition Machine (FPDS), which uses electron beam technology to capture and store information on patterns, defects, and other features. The tool also contains a proprietary Pattern Recognition software and an automated analysis software, allowing the asset to accurately identify, measure and categorize defects and features. KLA CI T120 inspection model adds a 4th Image Acquisition stage which enables efficient and accurate inspection of highly dense features and details within each pattern. It also features an enhanced Pattern Identification Equipment (PIS) to automate pattern recognition, measurement and classification process. ICOS CI T 120 system also supports multiple wafer sizes with its larger field of view (FOV), allowing for greater process throughput and faster analysis. ICOS CI-T120 offers a variety of advanced capabilities such as wafer map, particle or defect capture and automatic defect fixes. It also includes a high-speed data processing function, supporting critical time-sensitive operations. Finally, its Integrated Saturation Scanning (ISS) feature ensures that areas of high pattern density are properly inspected and checked. ICOS CI T120 is an advanced, secure and powerful mask & wafer inspection unit that utilizes advanced imaging technology to deliver superior accuracy and performance. It is ideal for use in any industrial application requiring high-precision inspection.