Used KLA / TENCOR / ICOS WI-2000 #293597008 for sale

ID: 293597008
Vintage: 2007
2D Wafer inspection system 2007 vintage.
KLA / TENCOR / ICOS WI-2000 is an advanced mask and wafer inspection equipment designed to improve yield and quality of complex IC manufacturing. The system allows for non-destructive examination of semiconductor wafers for defects both during production and after device fabrication. KLA WI-2000 consists of both mechanical and electronic components, which combine to provide comprehensive image analysis of the wafers. The platform is capable of optical imaging and scatterometry, defect classification, parameter mapping and electrical testing. The unit utilizes the latest in intelligent micro-camera technology which is capable of inspecting multiple image fields at high speeds, while distinguishing between the different types and sizes of defects. ICOS WI-2000 also uses an automated wafer handling machine and vacuum handling technology to ensure the wafers retain their integrity throughout the inspection process. The wafer products are also supported by a wide range of custom built in-line metrology tools, which provide design-rule checking and critical defect review capabilities. To ensure that the tool is able to detect any potential inaccuracies in the wafer design or fabrication process, TENCOR WI-2000 utilizes a high-end image processing asset with advanced software and specialized hardware. This helps to minimize false-alarms and quickly identify any unusual characteristics which may potentially lead to yield and device reliability problems. The model also has features to support deep learning and artificial intelligence algorithms, with the aim of automating the defect detection process, and allowing for dynamic corrections of frequently missed defects. This helps to improve yields and reduce time to market. WI-2000 is designed to be user-friendly and simple to operate, making it suitable for use by operators of all levels, from entry-level to expert. The equipment is also compliant with industry standards such as IEEE 2161 and AEC Q100 and is validated to MIL-PRF-38535 requirements. In summary, KLA / TENCOR / ICOS WI-2000 is an advanced mask and wafer inspection system which provides accurate and reliable defect detection, while also offering the ability to automate the process and reduce time to market. The unit offers a wide range of image processing and automation capabilities, making it suitable for a range of wafer inspection requirements.
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