Used KLA / TENCOR INS 3000 / 3300 #9195887 for sale

KLA / TENCOR INS 3000 / 3300
ID: 9195887
Wafer defect inspection system.
KLA / TENCOR INS 3000 / 3300 is an automated equipment for mask and wafer inspection that is the gold standard for advanced performance and consistency. It combines the powerful capabilities of the 3D full-field imaging subsystem with the flexibility of the 2D wafer and defect imaging to provide a comprehensive inspection system. KLA INS 3000 / 3300 utilizes the latest high-resolution imaging and inspection technology to capture the high-resolution images of defects and wafer topography at both macro and micro scales. This allows for greater precision and accuracy when inspecting microelectronic components and controlling wafer geometries. The automated wafer scanning also utilizes high-speed CNC technology to ensure accurate measurement and high throughput rates. The 3D imaging subsystem captures accurate 3D reconstructions of wafer topography and defect locations. This is combined with KLA proprietary wafer alignment unit to achieve sub-micron accuracy in defect location. The imaging data from this machine is examined in detail for defects, which is then compared to library reference standards. This tool allows for microscope-level resolution of defects over large wafer areas. The 2D defect imaging asset enables high-precision evaluation at the nanometer level for both defects and their associated features. This imaging model enables unparalleled resolution and defect visibility, with detection levels well below the 10nm level. TENCOR INS 3000 / 3300 mask and wafer inspection equipment is one of the leading systems in the industry. It offers customers superior performance and accuracy with a wide range of imaging and defect detection capabilities. It provides the highest quality results and eliminates costly manual sampling and inspection. It is an ideal choice for both R&D and high-volume production in many industries.
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