Used KLA / TENCOR MPV-CD #9093155 for sale

KLA / TENCOR MPV-CD
ID: 9093155
Line width measuring system, 5".
KLA / TENCOR MPV-CD is a mask and wafer inspection equipment designed for the semiconductor production industry. It is designed as a modular structure, consisting of several subsystems, all designed to work together in order to provide an automated system for the inspection of semiconductor masks and wafers. These subsystems include the automated stage, an imaging unit, a robot loader, and a camera machine. The automated stage is responsible for facilitating the movement of the wafer and mask over the imaging systems. It is built with precision and accuracy in mind, allowing the user to effortlessly position the wafer or mask for imaging. This ensures that the final images are sharp and of high quality. The imaging tool consists of a cooled CCD array camera, which provides a high resolution image of the wafer or mask. Additionally, the imaging asset is equipped with a zoom lens, which allows for the adjustment of size and resolution of the image without requiring manual intervention. The robot loader is designed to move the wafer or mask from one model to another. The robot loader is capable of moving the wafer or mask at controlled speeds, making it ideal for transferring multiple wafers and masks. Additionally, it is equipped with a sensing and timer equipment, which ensures that the wafer or mask is correctly loaded and the image transfer is successfully complete. The camera system is responsible for capturing the image of the wafer or mask and transferring it to the imaging unit. The camera machine is built with the utmost accuracy, ensuring that the image it captures is of the highest quality. In addition, the camera tool is equipped with an automated focusing asset, which ensures that the image is focused onto the imaging model. Once the image is captured, it is submitted to the image processing equipment for processing. The image processing system is designed to detect and measure a variety of features, including features such as defects, contaminations, anomalies, and even die shapes. Lastly, the unit uses a control machine to ensure that each of the subsystems are synchronized and running efficiently. This control tool allows for a seamless operation, allowing it to complete tasks quickly and efficiently. KLA MPV-CD is a state-of-the-art asset designed to provide an automated solution for the semiconductor production industry. It is equipped with several subsystems which allow for the efficient inspection of semiconductor masks and wafer, providing an ideal solution for semiconductor production facilities.
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