Used KLA / TENCOR / PROMETRIX Candela CS920 #9269026 for sale

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ID: 9269026
Vintage: 2016
Optical surface analyzer SiC/SiC (EPI Layer) 2016 vintage.
KLA / TENCOR / PROMETRIX Candela CS920 is a high-performance integrated wafer testing and metrology platform engineered for high volume semiconductor production. The platform offers a complete range of test and measurement services for wafer production, from a single-step metrology to system-level wafer testing. The platform includes advanced optical and microelectromechanical (MEMS) technologies, enabling highly accurate non-contact 3D imaging of the surface topography of the wafer. This is supported by a variety of imaging software options, allowing users to capture, process and analyze data with pinpoint accuracy. The platform is ideal for measuring critical dimensions (CDs), isolating defects and performing a range of parametric tests. The testing and measurement capabilities of the platform include resistivity tests, leakage measurements, surface characterization, electrical capacitor and resistor testing, acoustic measurements, failure analysis, die-to-die comparison, isolated defect detection and roughness measurements. The platform features a powerful, upgradeable architecture, offering robust performance and reliable processing capabilities for a wide variety of wafer testing and metrology applications. It comes with a wide range of customization options, allowing users to tailor the platform to their individual needs. Additionally, the platform supports full automation capabilities, with a fully integrated robotics system that allows up to 40 devices to be accurately tested simultaneously. The platform leverages the latest in data processing, image and signal analysis technology, allowing users to generate comprehensive wafer test reports and analysis in real time. This includes the ability to interface with a variety of databases, allowing users to access a single, comprehensive test result repository for data tracking and analysis. In conclusion, KLA Candela CS920 is a highly advanced wafer testing and metrology platform designed to streamline and simplify a variety of wafer production applications. The platform combines advanced optical and MEMS technologies, automated robotics, a powerful upgradeable architecture and full customization capabilities to deliver accurate and reliable data to users in real time.
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