Used KLA / TENCOR / PROMETRIX INS 3300 #9098958 for sale

ID: 9098958
Wafer Size: 12"
Vintage: 2006
Review station, 12" 2006 vintage.
KLA / TENCOR / PROMETRIX INS 3300 is an advanced mask and wafer inspection system designed to efficiently inspect printed circuits for defects like missing lines, shorts, opens, fiducial misalignments, and more. It offers both 2D and 3D inspection capabilities, providing users with powerful imaging capabilities to identify and eliminate defects. The system is based on innovative imaging technologies like pattern recognition, calibration, metrology, and inspection. Each image captures a number of attributes, such as the optical conditions, defect sizes, patterns, locations, and other relevant information about the printed circuit. This information is then used to accurately detect potential defects. KLA INS 3300 is capable of capturing, searching, and measuring multiple layers at a single go. It provides automatic creation of layout submission images and user-defined WQJ (wafer quality joint) maps. A number of available options includes line graining, trace/space accuracy, and die alignment. Additionally, its Automatic Detection of Critical Dimensions (ADCD) feature allows for automatic screening of dimensions across multiple substrates and layers. TENCOR INS 3300 features a high-throughput, automated cluster inspection station. It integrates Ethernet connectivity to any device in the cluster for rapid image transfer and data-mapping. It also provides an optimized mask changeover time that reduces operational costs. Furthermore, its production-inspection system is designed to streamline inspection and test processes. It delivers fast defect inspection, resulting in higher yields and improved accuracy of inspection results. It also enables automated fault isolation and characterization, enabling manufacturers to precisely identify the root cause of failures and resolve them quickly. In conclusion, PROMETRIX INS 3300 is an excellent choice for mask and wafer inspection applications. It simplifies and speeds up inspection, while providing accurate defect detection. Its innovative features and high-throughput capabilities make it an ideal solution for modern semiconductor manufacturing lines.
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