Used KLA / TENCOR / PROMETRIX INS 3300 #9206058 for sale

KLA / TENCOR / PROMETRIX INS 3300 is a mask and wafer inspection equipment designed for advanced semiconductor manufacturing. It is a high resolution system that combines a sophisticated optical imaging unit with an advanced metrology machine. It is capable of wafer level and die level inspection, and can detect a wide range of defects on a variety of substrates. The optical imaging tool consists of a high-resolution CCD camera and a powerful spectral imaging asset. The CCD camera allows for precise imaging of different substrates such as silicon, metals, and polymers. The optical imaging model can detect a variety of defects such as scratches, scratches surrounded by debris, particles, and line width deviations. In terms of metrology, KLA INS 3300 utilizes an automated point-source alignment equipment to accurately and quickly measure critical parameters such as line widths,Overlay and sensitivity. This system can also be used for non-destructive depth profile measurements, permittivity measurements, and critical dimension measurements. The unit is also equipped with an advanced software package that allows for automated inspection of wafer and die level defects. This software can detect defects such as line-width variations, particle and debris, and overlay errors. It can also detect bridging defects through line-edge profiling and sidewall angle measurements. Overall, TENCOR INS 3300 is an advanced mask and wafer inspection machine designed for modern semiconductor manufacturing. Its combination of optical imaging and metrology systems provide an unparalleled level of accuracy and precision for device inspection. Additionally, its robust software package allows for automated defect detection, ensuring the highest yield from all substrate types.