Used KLA / TENCOR / PROMETRIX INS 3300 #9235814 for sale

KLA / TENCOR / PROMETRIX INS 3300 is a fully integrated mask and wafer inspection equipment that utilizes an automated beam deflection scanning mechanism to find defects and contaminants in the targets of semiconductor devices. This system allows for high-resolution imaging of the mask and wafer that is being inspected, ensuring accurate and reliable analysis. The unit is designed to detect and reject defect-ridden devices long before they reach the customer, eliminating unnecessary costs and waste. KLA INS 3300 is ideal for use in a wide range of semiconductor manufacturing, design and failure analysis processes. TENCOR INS 3300 utilizes a unique 'Cantilever' design that optically scans across the surface of the wafer or mask, magnifying the image to reveal defects and contaminants. Its scanning accuracy is unrivalled, with a scan rate exceeding 20 nanometers per second. This provides the highest accuracy and reliability required in the inspection process. The sensor within the machine is capable of measuring the difference between two states, allowing the inspector to more accurately detect anomalies on the wafer or mask. Additionally, PROMETRIX INS 3300 uses advanced proprietary algorithms to detect potential defects and contaminants in less than four seconds. This ensures the highest level of accuracy in defect and contaminant detection, drastically reducing the time it takes for inspectors to complete their tasks. Additionally, additional algorithms are used to segment, compare and classify patterns and shapes on the device surface. Overall, INS 3300 is an excellent choice for any semiconductor manufacturer looking for the most advanced mask and wafer inspection tool on the market. Its innovative design, reliable accuracy and excellent performance makes it one of the premier choices for companies striving for accuracy and speed in the inspection process.