Used KLA / TENCOR RS-200 #9157130 for sale

KLA / TENCOR RS-200 mask and wafer inspection equipment is a sophisticated, high-precision tool used in semiconductor manufacturing to detect flaws and ensure the quality of microchips. The system combines advanced optics and proprietary algorithms to precisely measure and analyze small features on extremely small wafers and masks. The main components of the unit include a scanner, imaging machine, light source, and continuous and pulse wafer reading support. The scanner is responsible for guiding the microscope arm to the precise coordinates of each feature inspected across the wafer or mask. The imaging tool processes the raw images captured by the scanner with highly advanced algorithms that eliminate false positives and interpret the data. Finally, the light source ensures that the wafer andmask is illuminated correctly. This is particularly important for viewing finer features that would otherwise be difficult to see. KLA RS-200 also features a powerful, yet easy-to-use interface to control inspection parameters like scanning speed, industry standards, defect parameters, defect size, noise levels, and so on. This makes it easy for operators to customize the asset to meet their specific needs, allowing them to quickly inspect different wafers and masks with minimal downtime. TENCOR RS-200 has the highest resolution currently available in the market for detecting defects, measuring gaps, and checking critical dimensions. It can detect minute defects down to 4nm which ensures the highest quality of production. The model also offers a wide depth of field, covering large visual areas with a single image, as well as a high level of automation, which lets users inspect dozens of wafers and masks in one go. Overall, RS-200 is an excellent tool for scanning and analyzing wafers and masks with high accuracy and precision. With its advanced optics, sophisticated algorithms, and easy-to-use interface, it offers manufacturers an efficient, reliable, and cost-effective solution for inspecting microchips.