Used KLA / TENCOR SLF27 #9298724 for sale

KLA / TENCOR SLF27 is a mask and wafer inspection equipment that uses innovative proprietary scanning technology to scan the wafer for any anomalies or irregularities. It is specifically designed to detect any physical defects on mask and wafer surfaces. The system utilizes specialized optical inspection technology to closely analyze the features of a wafer or mask for any potential issues. KLA SLF27 utilizes a Hybrid Optical Scanning Technology which combines two cameras equipped with proprietary optics to collect images of every defect. The unit is highly sensitive, allowing for precise and efficient inspection and pinpoint defect coverage. This efficient detection enables the machine to quickly identify any abnormality or defect and display it in an easy-to-read format. TENCOR SLF27 is capable of quickly scanning the surface of a mask or wafer to detect any discrepancies between it and previously established specifications. With an average pattern inspection cycle time of 0.2-0.4 seconds and a mask inspection cycle time of 0.1-0.2 seconds, the machine can quickly identify any errors or deviations from the spec. The integrated intuitive software makes it easy to accurately analyze data with simple and comprehensive controls. Furthermore, SLF27 tool is equipped with specialized features that improve productive yield. With a 7-inch touch screen display, users can effortlessly scan and inspect with outstanding accuracy. The hybrid OET (Optical Efficiency Tweezers) allows users to accurately measure each defective element with its 10-micron resolution. The asset also allows users to measure defect size with a hi-resolution imaging technology. KLA / TENCOR SLF27 is a highly efficient and advanced mask and wafer inspection model with advanced features to help improve yield and optimize inspection. The hybrid OET and intuitive software make it extremely effective, with fast scanning and analysis time that helps increase production and reduce cost. The equipment is highly reliable, with precise optics and hi-resolution imaging technology allowing for accurate and pinpoint detection of defective elements. KLA SLF27 system is an invaluable tool to any semiconductor company to ensure high-quality products.