Used KLA / TENCOR SP1-DLS #9222684 for sale

KLA / TENCOR SP1-DLS is an automated mask and wafer inspection equipment built to deliver industry-leading performance, speed and accuracy. KLA SP1 DLS is a reliable system that is capable of identifying critical particle and contamination-related defects, and other defects associated with wafer processing. It features high throughput with superior speed and flexibility, allowing it to be easily configured to a range of inspection needs. TENCOR SP 1-DLS utilizes a 4-channel laser detection unit to perform both 2D and 3D inspection of surfaces at a range of magnifications. It offers superior resolution and accuracy compared to other mask and wafer inspection systems, providing industry leading performance in challenging applications. By combining advanced pattern and variable light source technologies, KLA SP 1-DLS is able to detect a wide range of defects, including light points, dark points, foreign body particles, and line edge roughness. In addition to its superior mask and wafer inspection capabilities, KLA / TENCOR SP1 DLS also offers comprehensive data processing, analysis, and reporting features. Its powerful data acquisition and analysis capabilities ensures that data can be quickly and accurately analyzed. The machine supports a wide range of defects based on the user's specific requirements. Additionally, KLA / TENCOR SP 1-DLS also supports automated defect classification and provides comprehensive data reporting capabilities. SP1 DLS is designed for both cleanroom and laboratory environments, and is easily upgradable to meet changing needs. Its integrated alignment and staging capabilities ensure that the tool stays up to date and can quickly adapt to changing technology trends. In addition, KLA offers comprehensive technical support, allowing users to take full advantage of all of the features of KLA SP 1 DLS without having to worry about asset maintenance and reliability. Overall, KLA SP1-DLS is an automated mask and wafer inspection model that provides reliable performance and accuracy. It is an advanced equipment that is built to accurately identify and classify defects, enabling users to find and address issues quickly and efficiently. In addition, its advanced data processing, analysis, and reporting features ensure that the system can be tailored to meet exact needs. SP 1 DLS offers unparalleled flexibility and performance, making it the ideal choice for critical mask and wafer manufacturing applications.