Used KLA / TENCOR SP1-DLS #9227708 for sale

KLA / TENCOR SP1-DLS is an advanced optical mask and wafer inspection equipment designed for precise defect detection and management. It is a high-performance automated optical inspection system fitted with advanced optics and sophisticated algorithms to detect and classify defects and features of ICs, masks, and wafers at the nano-scale level. KLA SP1 DLS unit provides an integrated set of hardware and software technologies which help accelerate the production of complex devices. Its advanced technology is used for both frontside and backside inspection and delivers automated defect review. TENCOR SP 1-DLS machine includes the stand-alone Mask SCORPION inspection tool as its main hardware component. This asset is capable of detecting defects and defects on both frontside and backside mask layers. It includes a state-of-the-art, fully programmable algorithm model as part of its hardware. It is integrated with the Waferscope optical inspection equipment for fully automated process that enables it to quickly detect defects, anomalies, or device specific features at the wafer level. This in-depth analysis helps in rapidly creating customized solutions which can be used to reduce production delays and maximize yields. KLA SP1-DLS has a precise alignment system which along with the help of the high-resolution optics enables it to inspect even ultra-small critical areas of both mask and wafer layers. This is powered by a High Density Risen Lens (HDRL) and provide unmatched repeatability and repeatability across multiple devices. SP 1-DLS also features a powerful Automated Defect Review (ADR) unit, which can provide process quality control feedback and early detection of process issues. This helps speed up the production process and reduce overall production costs. All this, with its sophisticated vector-guide mask to wafer alignment, ensures consistent performance and error-free results. With the help of these technologies, it helps in fast-tracking product yield optimization thereby allowing for smaller cycle times and greater production efficiency. KLA / TENCOR SP1 DLS is the perfect solution for high-accuracy, small-scale mask and wafer inspection. It helps in detecting and quickly rectifying errors and anomalies at the nano-scale level with great precision. And it's easy-to-use interface allows users to streamline production and ensure minimal delays. With its features, it is designed to enable process control, accuracy, and peak production rate.