Used KLA / TENCOR SP1-DLS #9261865 for sale

KLA / TENCOR SP1-DLS is a highly advanced automated mask and wafer inspection equipment designed specifically for a wide range of microelectronics applications. It features a variety of technologies for defect detection, including manual, semi-automatic, and fully automated inspection modes. The system consists of a high-resolution digital imaging unit with variable depth inspection capabilities. It offers high-resolution imaging polarization for analyzing mask features such as contacts, lines, and spaces. It also measures and calibrates semiconductor device performance characteristics and regulatory compliance via electrical testing. The mask and wafer inspection machine features an automated substrate handling tool to quickly and accurately load and unload test substrates. This allows for maximum throughput and efficiency, while maintaining the highest levels of precision and accuracy. It also features high-precision lensing for capturing high-definition images of wafers and substrates. This allows the asset to capture all of the necessary defect information for rapid analysis and reporting. The model's user interface is both intuitive and easy to use. It features a full-screen calibration setup and a powerful graphical user interface that allows the user to quickly and easily determine observed defects. The user can interact with data directly on the equipment, allowing for quick and accurate analysis of wafer and mask images. The system also features remote monitoring capabilities, allowing users to track and analyze data from anywhere in the world. This allows users to analyze substrates and wafers from any location, without the need to be present. KLA SP1 DLS mask and wafer inspection unit is designed for the highest levels of accuracy and precision. It is reliable, easy to use, and provides top-level performance for a wide range of microelectronics applications.